Chroma ATE Inc.

IC測試分類機 (IC Test Handler)

Pick & Place Handler - Final Test (FT) and System Level Test (SLT)

IC測試分類機 (IC Test Handler)

Pick & Place Handler - Final Test (FT) and System Level Test (SLT)

Final Test
FT is taken to test before delivery of the product to customers. This test through test patterns to verify the functionality of the device and
measure the electrical characteristics to meet the desired specifications. The purposes of testing are listed as below.

System Level Test
In conventional IC backend process, to ensure shipment quality, most companies test packaged devices at speed with full function.
However
this induces several issues :

  1. Device shipment quality is not ensured due to the difference between ATE and real working environment
  2. Time to market is delayed due to months-long test program development on ATE's
  3. Test cost continually raises in contrast with reducing silicon cost.

IC測試分類機 (IC Test Handler)

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